International Journal of Electronic Devices and Networking
2025, Vol. 6, Issue 1, Part A
Title and Authors Name |
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Temperature and noise analysis of BiCMOS: Based RF circuits James Chisale, Monica Gondwe and Chikondi Banda Int. J. Electron. Devices Networking, 2025; 6(1): 01-06 |
Enhancing RF and analog circuit performance with BiCMOS semiconductor technology Camilla Läckberg and Stieg Lagerlöf Int. J. Electron. Devices Networking, 2025; 6(1): 07-10 |
Cadence virtuoso-based design and analysis of high-speed BiCMOS amplifiers Rohit Jha Int. J. Electron. Devices Networking, 2025; 6(1): 11-14 |
Machine learning for network security in IoT: Enabled smart systems Amina Fadhil Int. J. Electron. Devices Networking, 2025; 6(1): 15-19 |
Monte Carlo simulation for noise analysis in Sigma-Delta ADCs Mohsen Ebrahim Int. J. Electron. Devices Networking, 2025; 6(1): 20-23 |
Simulation of wireless sensor networks (WSN) using NS-3 and OMNeT++ Jassim Abdullah Int. J. Electron. Devices Networking, 2025; 6(1): 24-30 |