International Journal of Electronic Devices and Networking
  • Printed Journal
  • Refereed Journal
  • Peer Reviewed Journal

P-ISSN: 2708-4477, E-ISSN: 2708-4485
Peer Reviewed Journal

International Journal of Electronic Devices and Networking


2025, Vol. 6, Issue 1, Part A
S. No. Title and Authors Name
1
Temperature and noise analysis of BiCMOS: Based RF circuits
James Chisale, Monica Gondwe and Chikondi Banda
Int. J. Electron. Devices Networking, 2025; 6(1): 01-06
Abstract  |  Download  |  Country: Malawi  |  File Size: 175 KB  |  Views: 61   Downloads: 21
2
Enhancing RF and analog circuit performance with BiCMOS semiconductor technology
Camilla Läckberg and Stieg Lagerlöf
Int. J. Electron. Devices Networking, 2025; 6(1): 07-10
Abstract  |  Download  |  Country: Sweden  |  File Size: 235 KB  |  Views: 66   Downloads: 19
3
Cadence virtuoso-based design and analysis of high-speed BiCMOS amplifiers
Rohit Jha
Int. J. Electron. Devices Networking, 2025; 6(1): 11-14
Abstract  |  Download  |  Country: India  |  File Size: 318 KB  |  Views: 39   Downloads: 13
4
Machine learning for network security in IoT: Enabled smart systems
Amina Fadhil
Int. J. Electron. Devices Networking, 2025; 6(1): 15-19
Abstract  |  Download  |  Country: Iraq  |  File Size: 446 KB  |  Views: 36   Downloads: 13
5
Monte Carlo simulation for noise analysis in Sigma-Delta ADCs
Mohsen Ebrahim
Int. J. Electron. Devices Networking, 2025; 6(1): 20-23
Abstract  |  Download  |  Country: Iran, Islamic Republic of  |  File Size: 505 KB  |  Views: 30   Downloads: 13
6
Simulation of wireless sensor networks (WSN) using NS-3 and OMNeT++
Jassim Abdullah
Int. J. Electron. Devices Networking, 2025; 6(1): 24-30
Abstract  |  Download  |  Country: Iraq  |  File Size: 741 KB  |  Views: 31   Downloads: 13
International Journal of Electronic Devices and Networking
Call for book chapter