International Journal of Electronic Devices and Networking
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P-ISSN: 2708-4477, E-ISSN: 2708-4485
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International Journal of Electronic Devices and Networking


2025, Vol. 6, Issue 1, Part A
A semi-empirical model for molecular electron-impact ionization cross sections


Author(s): Sachin Kumar

Abstract: This work presentsrna semi-empirical model for calculating molecular electron-impact ionizationrncross sections, which are critical parameters in understanding molecularrninteractions in fields such as plasma physics, astrophysics, and radiationrnchemistry. The model combines theoretical foundations with empirical data tornaccurately predict ionization cross sections over a broad range of incidentrnelectron energies. By incorporating molecular orbital theory and effectivernionization potentials, the model accounts for variations in molecular structurernand electronic configuration, enabling more precise estimations than purelyrntheoretical or empirical approaches alone. Validation against experimentalrnmeasurements for various molecules demonstrates the model’s robustness andrnreliability. Additionally, the semi-empirical approach offers computationalrnefficiency, making it suitable for large-scale simulations and practicalrnapplications in modeling ionization processes. The model’s adaptability torndifferent molecular species and its ability to capture the energy dependence ofrnionization cross sections enhance its utility in diverse scientific andrntechnological domains. This development contributes to a better understandingrnof electron-molecule collisions, which is essential for designing advancedrnmaterials, interpreting spectroscopic data, and improving radiation damagernassessments. Overall, the semi-empirical model bridges the gap between theoryrnand experiment, providing a valuable tool for researchers studying molecularrnionization phenomena.

DOI: 10.22271/27084477.2025.v6.i1a.74

Pages: 31-35 | Views: 86 | Downloads: 29

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International Journal of Electronic Devices and Networking
How to cite this article:
Sachin Kumar. A semi-empirical model for molecular electron-impact ionization cross sections. Int J Electron Devices Networking 2025;6(1):31-35. DOI: 10.22271/27084477.2025.v6.i1a.74
International Journal of Electronic Devices and Networking
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